DC06: Portable ptychographic microscope for overpaint and crack analysis
Objectives
  • Adapt ptychographic microscopy, originally developed for semiconductor inspection, to stained-glass conservation.
  • Detect and quantify thin overpaint layers (a few 100 µm) and microcracks (< 1µm).
Expected results
  • A high-resolution (500 nm) portable microscope with long working distance (a few mm) for stained-glass fieldwork. Improved identification of previously undetectable defects.
Host Institution: VUB
Main Supervisor
  • Hyun-su Kim (VUB)
Co-supervisors & Advisor
  • Wendy Meulebroeck (VUB)
  • Malgorzata Kujawinska (WUT)
  • Marcin Czeski (ASP)